Inspection Makes the Difference
In addition to Vision inspection systems for the coplanarity of connectors or shielding systems, SAC also provides trim and form inspection systems. A related discipline is measuring particle deposition in cleanrooms. The techniques that can be used for measurements in the semiconductor industry range from line scan technology to depth from shading.
Trim and Form
Trim and form Vision inspection for a Belgian manufacturer of Hall sensors. To build compactly, all telecentric lenses and cameras are mounted horizontally on the right. The suspension is done via the heavy lenses. By using mirrors, the images are captured. The underexposure is created with a diffuser that rotates along and is illuminated from the fixed environment, ensuring there are no rotating cable connections.
Semiconductor Assembly
For a Finnish manufacturer, sprayed products are inspected. Two cameras are used to check the pins. The top camera and the small dome lighting are used to verify dimensions and to check for contamination that may have occurred during the spraying process. The dome lighting prevents metal reflections.